Microstructural Characterization of Au-In Thin Film Deposited by Electron Beam Evaporation

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dc.creatorAzman Jalar
dc.creatorMuhammad Azmi Abdul Hamid
dc.creatorNorliza Ismail
dc.date2023-11-06T08:55:46Z
dc.date2023-11-06T08:55:46Z
dc.date2009
dc.date.accessioned2024-10-21T02:35:41Z
dc.date.available2024-10-21T02:35:41Z
dc.identifier0126-6039
dc.identifierukmvital:12350
dc.identifierhttps://ptsldigital.ukm.my//jspui/handle/123456789/587317
dc.identifierSiri Q1.S23
dc.identifier.urihttps://repoemc.ukm.my/handle/123456789/17114
dc.languageen
dc.publisherPenerbit UKM
dc.relationSains Malaysiana
dc.relationhttp://journalarticle.ukm.my,http://www.ukm.my/jsm/
dc.subjectAu-In thin film
dc.subjecte-beam evaporation
dc.subjectmicrostructure
dc.subjectTEM
dc.subjectXPS
dc.titleMicrostructural Characterization of Au-In Thin Film Deposited by Electron Beam Evaporation
dc.typeJournal Article

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